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Alternative NSN: 5962-01-411-8751 |
Item Name: Microcircuit Memory |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 014118751 |
NCB Code: USA (01) |
Manufacturers: Integrated Device Technology Inc , Honeywell International Inc , Dla Land And Maritime |
Part No | NSN | Item Name | Manufacturer | QTY | RFQ |
---|---|---|---|---|---|
NH2808885-6 1S | 5962-01-411-8751 | microcircuit memory | integrated device technology inc | Avl | RFQ |
NH2808885-6 1S | 5962-01-411-8751 | microcircuit memory | honeywell international inc | Avl | RFQ |
NH2808885 6 1S | 5962-01-411-8751 | microcircuit memory | dla land and maritime | Avl | RFQ |
IDT7201LA50DB | 5962-01-411-8751 | microcircuit memory | honeywell international inc | Avl | RFQ |
IDT7201LA50DB | 5962-01-411-8751 | microcircuit memory | dla land and maritime | Avl | RFQ |
IDT7201LA50DB | 5962-01-411-8751 | microcircuit memory | integrated device technology inc | Avl | RFQ |
2808885-6 1S | 5962-01-411-8751 | microcircuit memory | integrated device technology inc | Avl | RFQ |
2808885-6 1S | 5962-01-411-8751 | microcircuit memory | honeywell international inc | Avl | RFQ |
2808885-6 1S | 5962-01-411-8751 | microcircuit memory | dla land and maritime | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND RADIATION HARDENED |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM INPUT |
CRHL | (NON-CORE DATA) BIT QUANTITY | 4608 |
NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 135.0 DEG CELSIUS |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
CZER | MEMORY DEVICE TYPE | FIRST-IN FIRST-OUT |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
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