MRC | Criteria | Characteristic |
---|---|---|
AARG | RELIABILITY INDICATOR | NOT ESTABLISHED |
ABDN | TERMINAL SURFACE TREATMENT | COPPER AND TIN |
ABJT | TERMINAL LENGTH | 1.875 INCHES MINIMUM AND 2.125 INCHES MAXIMUM |
ADAQ | BODY LENGTH | 0.600 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.125 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.125 INCHES MAXIMUM |
AEBT | TERMINAL DIAMETER | 0.020 INCHES NOMINAL |
AEHY | AMBIENT TEMP AT FULL RATED POWER | 25.0 DEG CELSIUS |
AEHZ | MAXIMUM OPERATING TEMP | 52.0 DEG CELSIUS |
AEJA | THERMAL TIME CONSTANT IN SECONDS | 38.0 |
AEJB | POWER DISSIPATION CONSTANT IN MILLIWATTS PER DEG CELSIUS | 4.5 |
AEJC | ZERO POWER TEMP COEFFICIENT OF RESISTANCE IN PERCENT PER DEG CELSIUS | -4.85 |
AEJD | TEMP POINTS FOR RESISTANCE READINGS AT ZERO POWER | -17.8 DEG CELSIUS 2ND RESISTANCE-TEMPERATURE POINT |
AEJD | TEMP POINTS FOR RESISTANCE READINGS AT ZERO POWER | -40.0 DEG CELSIUS 1ST RESISTANCE-TEMPERATURE POINT |
AEJD | TEMP POINTS FOR RESISTANCE READINGS AT ZERO POWER | 22.2 DEG CELSIUS 3RD RESISTANCE-TEMPERATURE POINT |
AEJD | TEMP POINTS FOR RESISTANCE READINGS AT ZERO POWER | 25.0 DEG CELSIUS 4TH RESISTANCE-TEMPERATURE POINT |
AEJD | TEMP POINTS FOR RESISTANCE READINGS AT ZERO POWER | 51.7 DEG CELSIUS 5TH RESISTANCE-TEMPERATURE POINT |
AKNA | INCLOSURE TYPE | ENCAPSULATED |
CQWD | III ZERO POWER RESISTANCE | 1.000 MEGOHMS |
CRQJ | ZERO POWER RESISTANCE TOLERANCE IN PERCENT AT REFERENCE TEMP | -1.0/+1.0 |
CTGT | REFERENCE TEMP IN DEG CELSIUS | 25.0 |
STYL | STYLE DESIGNATOR | WAFER |
TEST | TEST DATA DOCUMENT | 19200-11743606 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA |
TTQY | TERMINAL TYPE AND QUANTITY | 2 WIRE LEAD |
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